Using Analyzers in nSpec

Many analyses, especially the data filtering and data exporting type analyses, utilize the results of a previously-run analysis as their input. The previously-run analyses are input into analyses via the Base Analysis IDs and Base Analysis IDs Mode parameters. For more on using these parameters, see the Post-Analysis Referencing documentation.

For example, a common workflow involves first running Device Inspection, which identifies defects found via a scan, and then running Device Yield analysis using the defects found during Device Inspection as input.