Defect Classifier

Overview

To use the Defect Classifier Analyzer, a classification model must be trained with labelled training data.

The classification model file must be trained by Nanotronics applications engineer. To request assistance in training a defect classification model, please contact support@nanotronics.ai to request support.

Defect Classifier Analysis

Using the Defect Classifier Analysis

After training an AI to classify defects of interest, the model is ready to be used as part of any nSpec workflow. Defect Classification builds on the results of a base analysis like Basic Selection or Device Inspection. The base analysis is referenced through the Base Analysis IDs parameters.