Analyzer Reference
Analysis Types
Because nSpec analyses have a wide variety of functionality, they are categorized as followed:
Vision-based analysis: Vision-based analyzers analyze scan results with computer vision or AI to output a list of found defects.
Data filtering analysis: Data filtering analyses take the defect list found from a previously run analyses and perform filtering functions on the data, e.g. formatting custom reports with Custom Reporter.
Data exporting analysis: Given a prior analysis, data exporting analyses re-format the results of a previously-run analysis.
Advanced analysis: Misc. complex analyses. Refer to documentation for each one for specific information.
Type | Analysis | Input | Output |
|---|---|---|---|
Vision | Basic Selection (Contrast, Morphological Range) | Images | Defect list |
Vision | Basic Selection (Intensity, Exclusive) | Images | Defect list |
Vision | Basic Selection (Intensity, Inclusive) | Images | Defect list |
Vision | Device Inspection | Images | Defect list |
Vision | AI Analysis | Images | Defect class list |
Vision | Dislocation Defect Analyzer | Images | Defect list |
Vision | Surface Scattering Analysis | Images | Report |
Data Filtering | Custom Reporter | Defect list from prior analysis | Data |
Data Filtering | Device Yield | Defect list from prior analysis | Report |
Data Exporting | Custom Exporter | Defect list from prior analysis | Report |
Data Exporting | Report Summary Image Export | Prior analysis | Report |
Data Exporting | Cropped Images Analysis | Defect list from prior analysis | Images |
Advanced | High Resolution Mosaic Generator | ||
Advanced | Sub Scan Generator | ||
Advanced | Utility: Launch Executable |