nSpec v0.22.1.3 External Release Notes
nSpec Version 0.22.1.3
Release Date:
Documentation Updated:
Major Features:
Overview
This release patch fixes some key issues with nSpec’s automatic calibration utility, and Gen4 AI Analysis when run on Device Scans. This version also implements a new feature for the Custom Exporter post-analysis, which can now export customizable KLARF files.
Upgrading to v0.22.1.3
Library Update Not Required
If upgrading from a version more than 1 release prior, please reference all intermediate release notes for upgrade steps for each version.
New Features
Highlights
NSPEC-5407: Custom Exporter - Customizable KLARF outputs
KLARF file exports are now supported as part of the universal Custom Exporter following any nSpec Analysis. Defects identified will be reported as part of the DefectList field within the KLARF file, with customizable columns reported based on customer-specific requirements. Column data can be defined as part of the Custom Exporter SQL query.
For assistance setting up a Custom Exporter SQL query for a customer integration, please contact the Nanotronics application engineering team at appengineering@nanotronics.co
New Features Changelog
Bug Fixes
Highlights
NSPEC-6168: Calibration utility moves stage inappropriately for objective resolution calibrations
For the last several releases, the calibration utility could not perform the Calibrate XY Objective Resolutions calibration successfully without manual intervention because the stage drove to incorrect places on the Nanotronics calibration wafer. This caused some headache for initial setup of new nSpec systems, but also for preventative maintenance to monitor stage accuracy is maintained across the lifetime of nSpec systems that have already been actively deployed. This fix addresses this issue such that the latest nSpec Calibration Wafer standard can now be used for stage accuracy monitoring using the automated functionality.
NSPEC-6645: Defects in Gen4 analysis always register to last device in image
When running a Gen4 analysis on a device scan, defect’s parent device ID will always be logged as the last device in the image, instead of the device ID of the device the defect is actually on. This has now been fixed.